Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems
Journal Article
Wei, H., Johnston, E., & Binnie, D. (1998)
Experimental approach for measuring resolution of complementary metal oxide semiconductor imaging systems. Optical Engineering, 37(9), 2565. https://doi.org/10.1117/1.601778
This paper demonstrates a convenient experimental technique for measuring the resolution of a digital imaging system. The spatial frequency response of the system is obtained ...