Article
29 November 2021
Published
American Institute of Mathematical Sciences (AIMS)
10.3934/energy.2021055
2333-8334
Edinburgh Napier Funded
Shaik, H. M., Kabbani, A., Sheikh, A. M., Goh, K., Gupta, N., & Umar, T. (2021). Measurement and validation of polysilicon photovoltaic module degradation rates over five years of field exposure in Oman. AIMS Energy, 9(6), 1192-1212. https://doi.org/10.3934/energy.2021055
Research StudentSchool of Computing Engineering and the Built Environment
H.MohamedShaik@napier.ac.uk
Lecturer T&RSchool of Computing Engineering and the Built Environment
0131 455 2550
k.goh@napier.ac.uk
ProfessorSchool of Engineering and The Built Environment
0131 455 2334
n.gupta@napier.ac.uk
Photovoltaics, PV Degradation rate, Polysilicon, short circuit current, PV discoloration, visual loss factor, MATLAB, Standard test Conditions (STC)
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